機械剝離單層二硫化鎢薄膜

Monolayer tungsten disulfide (1H-WS?) flakes have been exfoliated from bulk tungsten disulfide (2H-WS?) onto 90nm thermal oxide and measures from 5micron up to 40micron in size. Each sample contains at least one single-layer WS? and is easy to find with the given x and y coordinates. Full characterization is performed on each monolayer flake. Typically, single-layer WS? show strong PL at 2.02eV with 0.04 to 0.08eV FWHM, All the data is provided with the sample and data includes Raman, photoluminescence, 100x optical images, and x,y coordinates.

Photoluminescence (PL): In the single layer form, tungsten diselenide possesses direct band-gap at 2.02eV. PL measurements show strong PL peak located at 2.02V with 0.04-0.08 eV PL FWHM.

Optical Microscope images: Each sample is inspected under the optical microscope and x-y coordinates are recorded.

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Possible applications:

Electronics
Sensors - detectors
Optics
STM - AFM applications
Molecular detection - binding
Ultra-low friction studies
Materials science and semiconductor research